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1

Reliability of a focused ion beam repair on digital cmos circuits

R Van Camp, K Van Doorselaer, I Clemminck

Journal:

Microelectronics Reliability

Year:

1996

Language:

english

File:

PDF, 257 KB

english, 1996

2

[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Reliability of a focused ion beam repair on digital CMOS circuits

Van Camp, R., Van Doorselaer, K., Clemminck, I.

Year:

1996

Language:

english

File:

PDF, 291 KB

english, 1996

3

Building-in reliability during library development: Hot-carrier degradation is no longer a problem of the technologists only!

R. Bellens, I. Clemminck, K. Van Doorselaer

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 265 KB

english, 1997

4

[IEEE Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference - Las Vegas, NV, USA (26-30 Sept. 1988)] Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference - Screen printing of CdS pastes for CdS-based solar cells

Clemminck, I., Goossens, R., Burgelman, M., Vervaet, A.

Year:

1988

Language:

english

File:

PDF, 522 KB

english, 1988

5

Micro-encapsulation of MDCK-ras-e cells prevents loss of E-cadherin invasion-suppressor function in vivo

Geert M. R. Vandenbossche, Georges K. De Bruyne, Erik A. Bruyneel, Guy Clemminck, Kris Vleminckx, Frans M. van Roy, Marc M. Mareel

Journal:

International Journal of Cancer

Year:

1994

Language:

english

File:

PDF, 2.18 MB

english, 1994

6

Structural analysis of “dry” Cu2SCdS solar cells

A Vervaet, D Vab Wassenhove, M Burgelman, I Clemminck

Journal:

Year:

1988

Language:

english

File:

PDF, 856 KB

english, 1988

7

Network processor requirements and benchmarking

F. Arts, P. Barri, I. Clemminck, A. Niemegeers, B. Pauwels, G. Taildeman, M. Vrana

Journal:

Computer Networks

Year:

2003

Language:

english

File:

PDF, 209 KB

english, 2003

8

On the interpretation of solid-state coulometry, used in studies of thin films of copper sulphide

A. Vervaet, M. Burgelman, I. Clemminck

Journal:

Journal of Materials Science Letters

Year:

1989

Language:

english

File:

PDF, 151 KB

english, 1989

9

SCREEN PRINTED AND SINTERED CdTe-CdS SOLAR CELLS

CLEMMINCK, IVAN, BURGELMAN, MARC, CASTELEYN, MARC, DEPUYDT, BEN

Journal:

International Journal of Solar Energy

Year:

1992

Language:

english

File:

PDF, 214 KB

english, 1992

10

[IEEE The Conference Record of the Twenty-Second IEEE Photovoltaic Specialists Conference - 1991 - Las Vegas, NV, USA (7-11 Oct. 1991)] The Conference Record of the Twenty-Second IEEE Photovoltaic Specialists Conference - 1991 - Interdiffusion of CdS and CdTe in screenprinted and sintered CdS-CdTe solar cells

Clemminck, I., Burgelman, M., Casteleyn, M., de Poorter, J., Vervaet, A.

Year:

1991

Language:

english

File:

PDF, 539 KB

english, 1991

11

[IEEE Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference - Las Vegas, NV, USA (26-30 Sept. 1988)] Conference Record of the Twentieth IEEE Photovoltaic Specialists Conference - Electrical and microstructural properties of screenprinted CdS layers for CdS-CdTe solar cells

Clemminck, I., Vervaet, A., Burgelman, M., Demeyere, A.

Year:

1988

Language:

english

File:

PDF, 454 KB

english, 1988

12

[IEEE 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC) - Waikoloa, HI, USA (5-9 Dec. 1994)] Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC) - Growth studies of CuInSe/sub 2/ using Cu-Se fluxes

Casteleyn, M., Burgelman, M., Depuydt, B., Niemegeers, A., Clemminck, I.

Year:

1994

Language:

english

File:

PDF, 1.41 MB

english, 1994